Ionizing Radiation Effects In Metal-Oxide Semiconductor Devices And Circuits
by Tso Ping Ma and PAUL V. Dressendorfer
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This overview describes the effects of ionizing radiation on MOS devices, and explains how to design, fabricate and test integrated circuits intended for use in a radiation environment. The text reviews the history of radiation-hard technology, and provides lists of recent research activities.
- Circuits & Components
- Publication Date:
- John Wiley & Sons Inc
- Country of origin:
- annotated ed
- 608 pages, Ill.
- Dimensions (mm):
- 241 x 166 x 34