The first comprehensive overview describing the effects of ionizing radiation on MOS devices, as well as how to design, fabricate, and test integrated circuits intended for use in a radiation environment. Also addresses process-induced radiation effects in the fabrication of high-density circuits. Reviews the history of radiation-hard technology, providing background information for those new to the field. Includes a comprehensive review of the literature and an annotated listing of research activities in radiation-hardness research.
- ISBN:
- 9780471848936
- 9780471848936
-
Category:
- Circuits & components
- Format:
- Hardback
- Publication Date:
-
07-06-1989
- Language:
- English
- Publisher:
- John Wiley & Sons Inc
- Country of origin:
- United States
- Pages:
- 608
- Dimensions (mm):
- 245x169x34mm
- Weight:
- 0.96kg
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