Ionizing Radiation Effects in Metal-oxide Semiconductor Devices and Circuits
by Paul V. Dressendorfer and T. P. Ma
Why Shop at Bookworld?
- - FAST shipping on everything
- - We beat Amazon by 10% guaranteed
- - We're a local Australian company
- - Millions of products at the best price
- - Hassle free 30-day returns
- - Local Customer Service
Typically received in 15-20 working days after dispatch
This title is IN STOCK!
You should expect to receive this within 15-20 working days after dispatch
Shipped directly to you within 24-48 hours from our US Supplier via International Post
This is not a tracked service
YOU PAY $416.75
The first comprehensive overview describing the effects of ionizing radiation on MOS devices, as well as how to design, fabricate, and test integrated circuits intended for use in a radiation environment. Also addresses process--induced radiation effects in the fabrication of high--density circuits. Reviews the history of radiation--hard technology, providing background information for those new to the field. Includes a comprehensive review of the literature and an annotated listing of research activities in radiation--hardness research.
- Circuits & components
- Publication Date:
- John Wiley & Sons Inc
- Country of origin:
- United States
- Dimensions (mm):