Ionizing Radiation Effects in Metal-oxide Semiconductor Devices and Circuits
by T. P. Ma and Paul V. Dressendorfer
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The first comprehensive overview describing the effects of ionizing radiation on MOS devices, as well as how to design, fabricate, and test integrated circuits intended for use in a radiation environment. Also addresses process--induced radiation effects in the fabrication of high--density circuits. Reviews the history of radiation--hard technology, providing background information for those new to the field. Includes a comprehensive review of the literature and an annotated listing of research activities in radiation--hardness research.
- Circuits & components
- Publication Date:
- John Wiley & Sons Inc
- Country of origin:
- United States
- Dimensions (mm):